| 摘要 |
The present invention relates to a mass analysis method and apparatus using a scanner light source, and more particularly, to a measurer for analyzing a mass of a sample ionized by the scanner light source. The mass analysis apparatus according to the present invention comprises: a laser portion which emits laser; a scanner module which performs driving such that the laser emitted by the laser portion irradiates a predetermined region; a sample holder which receives the laser from the scanner module and holds the sample; a second high voltage power source which supplies a voltage to the sample holder; a first ion optical system disposed at a predetermined distance away from the sample holder and forming a voltage so as to accelerate the ionized sample held by the sample holder; and a first high voltage power source which supplies a voltage to the first ion optical system. |
