发明名称 |
INSPECTION DATA ACQUISITION METHOD AND VISUAL INSPECTION APPARATUS |
摘要 |
PROBLEM TO BE SOLVED: To accurately detect unevenness and dirt of a surface of an inspection workpiece with a simple structure.SOLUTION: A visual inspection apparatus of an embodiment comprises: imaging means for taking an image of an inspection surface of an inspection workpiece; lighting means having area light sources whose irradiation ranges for the inspection surface overlap each other and a slit light source; control means for controlling imaging and switching of turn-on/turn-off of the area light sources and the slit light source; and inspection data acquisition means for acquiring a two-dimensional image of the inspection workpiece on the basis of an image taken during the period the slit light source is switched to be turned off and for acquiring a three-dimensional height data of the inspection workpiece on the basis of an image taken during the period the slit light source is switched to be turned on. |
申请公布号 |
JP2013242256(A) |
申请公布日期 |
2013.12.05 |
申请号 |
JP20120116459 |
申请日期 |
2012.05.22 |
申请人 |
RICOH ELEMEX CORP;YOKOHAMA RUBBER CO LTD:THE |
发明人 |
NAKAGAWA KEIJI;INOUE YASUYUKI;MATSUO HIROSHI;YAMAUCHI MASATO |
分类号 |
G01B11/24 |
主分类号 |
G01B11/24 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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