发明名称 INSPECTION DATA ACQUISITION METHOD AND VISUAL INSPECTION APPARATUS
摘要 PROBLEM TO BE SOLVED: To accurately detect unevenness and dirt of a surface of an inspection workpiece with a simple structure.SOLUTION: A visual inspection apparatus of an embodiment comprises: imaging means for taking an image of an inspection surface of an inspection workpiece; lighting means having area light sources whose irradiation ranges for the inspection surface overlap each other and a slit light source; control means for controlling imaging and switching of turn-on/turn-off of the area light sources and the slit light source; and inspection data acquisition means for acquiring a two-dimensional image of the inspection workpiece on the basis of an image taken during the period the slit light source is switched to be turned off and for acquiring a three-dimensional height data of the inspection workpiece on the basis of an image taken during the period the slit light source is switched to be turned on.
申请公布号 JP2013242256(A) 申请公布日期 2013.12.05
申请号 JP20120116459 申请日期 2012.05.22
申请人 RICOH ELEMEX CORP;YOKOHAMA RUBBER CO LTD:THE 发明人 NAKAGAWA KEIJI;INOUE YASUYUKI;MATSUO HIROSHI;YAMAUCHI MASATO
分类号 G01B11/24 主分类号 G01B11/24
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