发明名称 VACUUM-PROCESSING APPARATUS, VACUUM-PROCESSING METHOD, AND STORAGE MEDIUM
摘要 <p>[Problem] To provide a processing apparatus and processing method for stabilizing the resistance value of metal oxide film between substrates when a metal oxide film is formed on a substrate. [Solution] A target (31a) composed of a member for absorbing oxygen and a target (31b) composed of metal are disposed inside a vacuum container (2) capable of plasma sputtering, and a substrate (S) is conveyed into the vacuum chamber (2). The substrate (S) is covered with a cover plate (43), the target (31a) is sputtered and formed into a film inside the vacuum chamber (2), and oxygen inside the vacuum chamber (2) is made to adsorb onto the film. The cover plate (43) is moved from above the substrate S, the target (31b) is sputtered, and a metal film is formed on the substrate (S). The required amount of oxygen is fed from the cover plate (43), which has again been moved over the substrate (S), and a metal film is formed into a metal oxide film. The substrate (2) on which the target (31a) has been sputtered, on which oxygen inside the vacuum container (2) has been adsorbed, and on which a metal oxide film has been formed is conveyed out from the interior of the vacuum container (2).</p>
申请公布号 WO2013179575(A1) 申请公布日期 2013.12.05
申请号 WO2013JP02888 申请日期 2013.04.30
申请人 TOKYO ELECTRON LIMITED 发明人 FURUKAWA, SHINJI;GOMI, ATSUSHI;MIYASHITA, TETSUYA;KITADA, TORU;NAKAMURA, KANTO
分类号 C23C14/58;C23C14/02;C23C14/08;H01L21/8246;H01L27/105;H01L43/12 主分类号 C23C14/58
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