发明名称 PROCESS FOR DETERMINING POSITION PARAMETERS OF A MANUFACTURED SURFACE RELATIVE TO A REFERENCE SURFACE.
摘要 <p>Process implemented by computer means for determining position parameters defining the relative position of a manufactured derivable surface relative to a reference surface, the process comprising: a nominal surface providing step (S1), a measured surface providing step (S2), a deformation surface providing step (S3), a composed surface determining step (S4), and a parameters determining step (S5) during which the position parameters and at least one deformation parameter defining the deformation surface are determined by minimizing the difference between the nominal surface and the composed surface.</p>
申请公布号 MX2013013222(A) 申请公布日期 2013.12.02
申请号 MX20130013222 申请日期 2012.05.11
申请人 ESSILOR INTERNATIONAL(COMPAGNIE GENERALE D'OPTIQUE) 发明人 CHAUVEAU, JEAN-PIERRE;ALLIONE, PASCAL;STEIGELMANN, DANIEL
分类号 B24B13/00;B24B49/00;B24B51/00;G02B27/00;G02C7/02;G05B19/4097;G06Q50/00 主分类号 B24B13/00
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