发明名称 SOLID-STATE LASER AND INSPECTION SYSTEM USING 193NM LASER
摘要 Improved laser systems and associated techniques generate an ultra-violet (UV) wavelength of approximately 193.368 nm from a fundamental vacuum wavelength near 1064 nm. Preferred embodiments separate out an unconsumed portion of an input wavelength to at least one stage and redirect that unconsumed portion for use in another stage. The improved laser systems and associated techniques result in less expensive, longer life lasers than those currently being used in the industry. These laser systems can be constructed with readily-available, relatively inexpensive components.
申请公布号 WO2013177000(A1) 申请公布日期 2013.11.28
申请号 WO2013US41688 申请日期 2013.05.17
申请人 KLA-TENCOR CORPORATION 发明人 CHUANG, YUNG-HO ALEX;ARMSTRONG, J. JOSEPH;DRIBINSKI, VLADIMIR;FIELDEN, JOHN
分类号 H01S3/00 主分类号 H01S3/00
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