发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit which prevents the occurrence of malfunction with a small chip area.SOLUTION: A semiconductor integrated circuit according to the present embodiment comprises a plurality of logic switch parts and a plurality of logic transistor parts. Each of the logic switch parts includes a first nonvolatile memory and a second nonvolatile memory. Each of the plurality of logic transistor parts includes at least one logic transistor. The logic transistor includes at least one first transistor. Only the first transistor in the logic transistor is electrically connected to drains of the first and second nonvolatile memories and both gates of the first transistor are connected to the drains. Each of undersurfaces of the gates of transistors in the logic transistor, which sandwich the first and second nonvolatile memories, has a height from a top face of a substrate lower than that of an undersurface of each of control gates of the first and second nonvolatile memories.
申请公布号 JP2013239597(A) 申请公布日期 2013.11.28
申请号 JP20120111974 申请日期 2012.05.15
申请人 TOSHIBA CORP 发明人 YASUDA SHINICHI;TATSUMURA KOSUKE;MATSUMOTO MARI;ZAITSU KOICHIRO;ODA MASATO;KINOSHITA ATSUHIRO;HAGISHIMA DAISUKE;NISHI YOSHIFUMI;KURITA TAKAHIRO;FUJITA SHINOBU
分类号 H01L21/8234;G11C16/04;H01L21/336;H01L21/76;H01L21/822;H01L21/8247;H01L27/04;H01L27/088;H01L27/10;H01L27/115;H01L29/788;H01L29/792;H03K17/687;H03K19/00;H03K19/094;H03K19/0948 主分类号 H01L21/8234
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