| 摘要 |
The present invention relates to a test probe and a manufacturing method for the test probe and, more specifically, to a test probe and a manufacturing method for the test probe, wherein the test probe which is used to electrically connect a terminal of a tested device and a pad of a test device to each other and is arranged within a housing comprises: an upper plunger which can come in contact with the terminal of the tested device; a barrel which is coupled to the upper plunger and has a hollow internal portion in a cylindrical shape, and which has a protruding portion that is protruded by being curved outwardly from the lower part of the barrel; a lower plunger having a portion that is inserted into the barrel and the remaining portion that is protruded from the barrel to the lower side; and an elastic bias member which is inserted into the barrel, and which elastically biases the lower plunger in a direction receding from the upper plunger. |
