发明名称 SEMICONDUCTOR DEVICE AND MEASUREMENT INSTRUMENT
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device and a measurement instrument, which achieve downsizing and reduction in wiring resistance.SOLUTION: A semiconductor device comprises: a lead frame 26; an oscillator 28 which includes a plurality of terminals spaced at predetermined intervals and which is mounted on an oscillator mounting region formed on a first surface of the lead frame 26 and having a width narrower than an interval between the terminals; an integrated circuit 30 mounted on a second surface of the lead frame 26 on an opposite side to the first surface; and bonding wires 52 for connecting the terminals of the oscillator 28 and terminals of the integrated circuit 30.
申请公布号 JP2013232550(A) 申请公布日期 2013.11.14
申请号 JP20120104176 申请日期 2012.04.27
申请人 LAPIS SEMICONDUCTOR CO LTD 发明人 TAKEMASA KENGO;YOSHIDA YUICHI;SONE NORIHISA;YAMADA KAZUYA;TAKEI AKIHIRO
分类号 H01L23/50;H01L25/00 主分类号 H01L23/50
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