发明名称 |
SEMICONDUCTOR DEVICE AND MEASUREMENT INSTRUMENT |
摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device and a measurement instrument, which achieve downsizing and reduction in wiring resistance.SOLUTION: A semiconductor device comprises: a lead frame 26; an oscillator 28 which includes a plurality of terminals spaced at predetermined intervals and which is mounted on an oscillator mounting region formed on a first surface of the lead frame 26 and having a width narrower than an interval between the terminals; an integrated circuit 30 mounted on a second surface of the lead frame 26 on an opposite side to the first surface; and bonding wires 52 for connecting the terminals of the oscillator 28 and terminals of the integrated circuit 30. |
申请公布号 |
JP2013232550(A) |
申请公布日期 |
2013.11.14 |
申请号 |
JP20120104176 |
申请日期 |
2012.04.27 |
申请人 |
LAPIS SEMICONDUCTOR CO LTD |
发明人 |
TAKEMASA KENGO;YOSHIDA YUICHI;SONE NORIHISA;YAMADA KAZUYA;TAKEI AKIHIRO |
分类号 |
H01L23/50;H01L25/00 |
主分类号 |
H01L23/50 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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