发明名称 |
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF |
摘要 |
<p>A semiconductor device in the present invention includes a semiconductor layer; a gate electrode which covers the end of the semiconductor layer; and an insulation layer which insulates the semiconductor layer and the gate electrode. The thickness of the insulation layer which insulates the area where the end of the semiconductor layer and the gate electrode are overlapped is greater than the thickness of the insulation layer which covers the central part of the semiconductor layer.</p> |
申请公布号 |
KR20130124468(A) |
申请公布日期 |
2013.11.14 |
申请号 |
KR20130127820 |
申请日期 |
2013.10.25 |
申请人 |
SEMICONDUCTOR ENERGY LABORATORY CO., LTD. |
发明人 |
YAMAZAKI SHUNPEI;SUZUKI YUKIE;ARAI YASUYUKI;MORIYA YOSHITAKA;IKEDA KAZUKO;TANADA YOSHIFUMI;TAKAHASHI SYUHEI |
分类号 |
H01L29/786;H01L21/336 |
主分类号 |
H01L29/786 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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