发明名称 SEMICONDUCTOR STRUCTURE HAVING ETCH STOP LAYER
摘要 A semiconductor structure includes a substrate, a conductive feature over the substrate, a conductive plug structure contacting a portion of an upper surface of the conductive feature, a first etch stop layer over another portion of the upper surface of the conductive feature, and a second etch stop layer over the first etch stop layer. The first etch stop layer is a doped etch stop layer. The first etch stop layer is to function as an etch stop layer during a predetermined etching process for etching the second etch stop layer.
申请公布号 US2013299987(A1) 申请公布日期 2013.11.14
申请号 US201313949631 申请日期 2013.07.24
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 LIN MEI-HSUAN;LIN CHIH-HSUN;CHAO CHIH-KANG;WANG LING-SUNG
分类号 H01L23/48 主分类号 H01L23/48
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