发明名称 Abnormality detection system, abnormality detection method, and abnormality detection program storage medium
摘要 Even if data includes a defect or an outlier in features thereof, the influence of the defect or the outlier of the features is suppressed to perform a highly precise abnormality detection, and data including high-dimensional features is processable to accomplish the highly stable detection of an abnormality. The abnormality detection system which detects abnormal data in a data sequence including data of multi-dimensional features, and the system includes storing or generating a generation distribution of features of the data and reference data indicative of normal data; obtaining, every piece of the data sequence, a probability that when features are virtually generated from the generation distribution, the features are nearer to the reference data than the features of each piece of the data; and taking the probability as a one-dimensional dissimilarity degree between each piece of the data and the reference data, thereby determining abnormal data.
申请公布号 US8584000(B2) 申请公布日期 2013.11.12
申请号 US200913123178 申请日期 2009.10.07
申请人 MONDEN AKIRA;NEC CORPORATION 发明人 MONDEN AKIRA
分类号 G06F7/02;H03M13/00 主分类号 G06F7/02
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