发明名称 |
Procedimiento de determinación de la sensibilidad de los componentes electrónicos frente a partículas |
摘要 |
To analyze an electronic component, this component is exposed to a focused laser beam. The information provided by the laser mapping relating to the position and to the depth of the sensitivity zones of the component is used as input parameter in prediction codes for quantifying the sensitivity of the mapped component to ionizing particles in the natural radioactive environment. The prediction codes are used to determine the occurrence of malfunctions in the electronic component. Determination of the risks associated with the radiative environment imposes two aspects: one, probabilistic, takes into account the particle/matter interaction and the other, electrical, takes into account the charge collection inside the electronic component.
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申请公布号 |
ES2428093(T3) |
申请公布日期 |
2013.11.05 |
申请号 |
ES20080843897T |
申请日期 |
2008.10.23 |
申请人 |
EUROPEAN AERONAUTIC DEFENCE AND SPACE COMPANY EADS;AIRBUS OPERATIONS;ASTRIUM SAS |
发明人 |
MILLER, FLORENT;BUARD, NADINE;WEULERSSE, CECILE;CARRIERE, THIERRY;HEINS, PATRICK |
分类号 |
G01R31/302;G01R31/00;G01R31/28;G01R31/308;G01R31/3181;G01R31/3183 |
主分类号 |
G01R31/302 |
代理机构 |
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地址 |
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