发明名称 METHOD OF CONTROLLING A PATTERNING DEVICE IN A LITHOGRAPHIC APPARATUS, DEVICE MANUFACTURING METHOD AND LITHOGRAPHIC APPARATUS
摘要 A system for controlling a patterning device in a lithographic apparatus using a patterning device having individually controllable elements that may only be set to two states. The method includes converting a representation of a pattern to be formed on the substrate into a plurality of area intensity signals, each corresponding to a radiation intensity level required to be set in a respective area of the patterning device in order to provide the desired pattern on the substrate and a separate step of converting each of the area intensity signals into control signals for a plurality of individually controllable elements that each correspond to the area of the patterning device.
申请公布号 KR20130119965(A) 申请公布日期 2013.11.01
申请号 KR20137019172 申请日期 2011.12.02
申请人 ASML NETHERLANDS B.V. 发明人 MULCKHUYSE WOUTER;DE JAGER PIETER;VAN ZWET ERWIN
分类号 H01L21/027;G03F7/20 主分类号 H01L21/027
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