发明名称 A METHOD OF FABRICATING A SEMICONDUCTOR DEVICE
摘要 <p>PURPOSE: A method for fabricating a semiconductor device is provided to prevent the agglomeration phenomenon of a compound by forming metal-semiconductor compounds after a contact structure is formed. CONSTITUTION: Semiconductor patterns (24) are formed on a semiconductor substrate. A lower insulating layer covering a lower interlayer dielectric is formed. A contact structure (48w) is separated from the semiconductor patterns. Insulating patterns covering the contact structure are formed. Metal-semiconductor compounds are formed on the exposed semiconductor patterns.</p>
申请公布号 KR20130119198(A) 申请公布日期 2013.10.31
申请号 KR20120042168 申请日期 2012.04.23
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 HWANG, YOUNG NAM
分类号 H01L21/8242;H01L21/28;H01L27/108 主分类号 H01L21/8242
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