发明名称 |
A METHOD OF FABRICATING A SEMICONDUCTOR DEVICE |
摘要 |
<p>PURPOSE: A method for fabricating a semiconductor device is provided to prevent the agglomeration phenomenon of a compound by forming metal-semiconductor compounds after a contact structure is formed. CONSTITUTION: Semiconductor patterns (24) are formed on a semiconductor substrate. A lower insulating layer covering a lower interlayer dielectric is formed. A contact structure (48w) is separated from the semiconductor patterns. Insulating patterns covering the contact structure are formed. Metal-semiconductor compounds are formed on the exposed semiconductor patterns.</p> |
申请公布号 |
KR20130119198(A) |
申请公布日期 |
2013.10.31 |
申请号 |
KR20120042168 |
申请日期 |
2012.04.23 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
HWANG, YOUNG NAM |
分类号 |
H01L21/8242;H01L21/28;H01L27/108 |
主分类号 |
H01L21/8242 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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