| 摘要 |
PURPOSE: A test handler is provided to offer technology capable of sharing the position areas of a customer tray for the loading of the semiconductor device and a customer tray for the unloading of the semiconductor device. CONSTITUTION: A test handler (100) comprises a test support part (110), a loading shuttle, a loading shuttle transport unit (130), a first unloading shuttle (151), a first unloading shuttle transport unit (160), a second unloading shuttle (152), a second unloading shuttle transport unit (170), a stacker part (180), a transfer (190), and a control unit (210), etc. The test support part is provided to support the test of the semiconductor device. The test support part comprises a loading table (111), a loading table transport unit (112), an unloading table (113), an unloading table transport unit (114), a test board (115), a connection unit (116), a loader (117), and an unloader (118). [Reference numerals] (AA) Back; (BB) Left; (CC) Right; (DD) Front |
