发明名称 |
COMPOSITION FOR SILICON WAFER POLISHING LIQUID |
摘要 |
PROBLEM TO BE SOLVED: To provide a composition for a silicon wafer polishing liquid or the like which is excellent in storage stability and can reduce surface roughness (haze) and surface defects (LPDs) of a silicon wafer while securing a polishing rate that guarantees good productivity.SOLUTION: A composition for a silicon wafer polishing agent comprises silica particles (component A), at least one or more nitrogen-containing basic compounds (component B) selected from among amine compounds and ammonium compounds, and a water-soluble polymer compound (component C) that contains 10 wt.% or more of a structural unit I represented by the specified general formula (1) and has a weight average molecular weight in the range from 50000 to 1500000 inclusive. |
申请公布号 |
JP2013222863(A) |
申请公布日期 |
2013.10.28 |
申请号 |
JP20120094240 |
申请日期 |
2012.04.17 |
申请人 |
KAO CORP |
发明人 |
MIURA JOJI;MATSUI YOSHIAKI;KATO YUKI |
分类号 |
H01L21/304;B24B37/00;C09K3/14 |
主分类号 |
H01L21/304 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|