发明名称 DESIGN EXAMINATION INFORMATION PROVIDING DEVICE, DESIGN EXAMINATION INFORMATION PROVIDING METHOD, AND PROGRAM FOR PROVIDING DESIGN EXAMINATION INFORMATION
摘要 PROBLEM TO BE SOLVED: To provide a design examination information providing device capable of presenting design examination information, such as an appropriate instruction item and an examination item to a design content of a design resultant.SOLUTION: A design examination information providing device includes: component identification information extracting means for extracting component identification information related to each of one or more design constituent elements from a design resultant; attribute information acquisition means for acquiring attribute information related to one or more attributes corresponding to component identification information related to each design constituent element extracted by the component identification information extracting means; and design examination instruction information acquisition means for acquiring, on the basis of attribute information acquired by the attribute information acquisition means, design examination instruction information for instructing examination to the design resultant.
申请公布号 JP2013222288(A) 申请公布日期 2013.10.28
申请号 JP20120092812 申请日期 2012.04.16
申请人 NEC CORP 发明人 SAKAGAMI HIDEKAZU;MOTOHASHI YOSUKE;OSHIMA DAISUKE
分类号 G06F17/50 主分类号 G06F17/50
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