发明名称 SAMPLE ANALYSIS ELEMENT AND DETECTOR
摘要 PROBLEM TO BE SOLVED: To provide a sample analysis element capable of connecting localized surface plasmon resonance with propagating surface plasmon resonance while the surface density of a hot spot is increased.SOLUTION: A sample analysis element 11 includes a plurality of metal nano rows 16. Each of the metal nano rows 16 includes a plurality of metal nano bodies 15 arrayed in a line at a first pitch SP smaller than a wavelength of incident light on a dielectric surface. The metal nano rows 16 are arrayed in parallel to each other at a second pitch LP larger than the first pitch SP.
申请公布号 JP2013221883(A) 申请公布日期 2013.10.28
申请号 JP20120094519 申请日期 2012.04.18
申请人 SEIKO EPSON CORP 发明人 SUGIMOTO MAMORU;AMAKO ATSUSHI;KOIKE HIDEAKI
分类号 G01N21/65;G01N21/27 主分类号 G01N21/65
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