发明名称 HIGH TEMPERATURE TESTING DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a high temperature testing device capable of measuring opening displacement of a test piece without being influenced by deformation of a jig or the test piece.SOLUTION: An opening displacement detection mechanism is provided with a pair of support shafts 51 disposed in a test piece 23, a reference plate 52, a movable plate 55, and a displacement detector 58. The support shafts 51 inserted in a hole part 47 and disposed in the test piece 23 are installed by the reference plate 52 where a rod member 54 is engaged and connected and by the movable plate 55 where a rod member 57 is engaged and connected. Between the rod member 54 and the rod member 57, a displacement detector 58 for detecting opening displacement of the test piece 23 by measuring a distance between the rod members 54 and 57 is provided.
申请公布号 JP2013217693(A) 申请公布日期 2013.10.24
申请号 JP20120086298 申请日期 2012.04.05
申请人 SHIMADZU CORP 发明人 KOMINE NORIAKI
分类号 G01N3/00;G01N3/18 主分类号 G01N3/00
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