发明名称 NONVOLATILE MEMORY AND WRITING METHOD THEREOF, AND SEMICONDUCTOR DEVICE
摘要 PURPOSE: A nonvolatile memory, a writing method thereof, and a semiconductor device are provided to include a series of operations detecting and modifying defective bits as the writing operation of a write-once memory in addition to a data writing operation, thereby reducing the possibility of defective bit generation. CONSTITUTION: A first writing circuit writes data to a first memory cell and to multiple second memory cells. A timing control circuit (111) outputs a first control signal, which enables a verification circuit (105), to the verification circuit. The verification circuit compares first data stored in a data register and second data stored in a memory cell, where writing was performed, among the multiple second memory cells, and outputs a determination signal. The timing control circuit outputs a second control signal enabling a second writing circuit (110) according to the determination signal. The second writing circuit allocates an address to the first memory cell according to the second control signal. [Reference numerals] (AA) Decision signal
申请公布号 KR20130115197(A) 申请公布日期 2013.10.21
申请号 KR20130112474 申请日期 2013.09.23
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 KATO KIYOSHI
分类号 G11C29/04;G11C29/00;G11C29/56;H01L27/10 主分类号 G11C29/04
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