发明名称 |
RFID TAG INSPECTION METHOD, AND INSPECTION DEVICE |
摘要 |
<p>The purpose of the present invention is to be able to collectively inspect the quality of multiple RFID tags arranged on an assembled base. An RFID tag inspection method involving a step in which a measurement signal is sent at once from a reader-writer to multiple RFID tags arranged on an assembled base and for processing a wireless signal, a step in which the response waves from each of the RFID tags are collectively read by the reader-writer, and a step in which the quality of each RFID tag is determined on the basis of the number and strength of the reception signals read by the reader-writer.</p> |
申请公布号 |
WO2013153697(A1) |
申请公布日期 |
2013.10.17 |
申请号 |
WO2012JP80493 |
申请日期 |
2012.11.26 |
申请人 |
MURATA MANUFACTURING CO., LTD. |
发明人 |
MUKAI TSUYOSHI;DOKAI YUYA |
分类号 |
G06K17/00;G01R31/28 |
主分类号 |
G06K17/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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