发明名称 RFID TAG INSPECTION METHOD, AND INSPECTION DEVICE
摘要 <p>The purpose of the present invention is to be able to collectively inspect the quality of multiple RFID tags arranged on an assembled base. An RFID tag inspection method involving a step in which a measurement signal is sent at once from a reader-writer to multiple RFID tags arranged on an assembled base and for processing a wireless signal, a step in which the response waves from each of the RFID tags are collectively read by the reader-writer, and a step in which the quality of each RFID tag is determined on the basis of the number and strength of the reception signals read by the reader-writer.</p>
申请公布号 WO2013153697(A1) 申请公布日期 2013.10.17
申请号 WO2012JP80493 申请日期 2012.11.26
申请人 MURATA MANUFACTURING CO., LTD. 发明人 MUKAI TSUYOSHI;DOKAI YUYA
分类号 G06K17/00;G01R31/28 主分类号 G06K17/00
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