发明名称 CALIBRATING DEVICE FOR IN-SITU STACK GAS ANALYZER
摘要 <p>PURPOSE: A device for automatically calibrating an in-situ gas measuring instrument is provided to remove the complexity of configuration thereof caused by converting an optical path, and to reduce the distortion of the optical path caused by reflection, thereby stably and accurately obtaining a measurement value. CONSTITUTION: A device for automatically calibrating an in-situ gas measuring instrument includes an outer casing (12), a retro-reflective body (14), a reflection releasing unit, and a reference gas feeding part (16). The main body (2) of the device has a light emitting part (6) and a probe (4), and the outer casing between the light emitting part and the probe has a first window (20) and a second window (22). The retro-reflective body inside the outer casing retro-reflects a light which penetrates through the first window. The reflection releasing unit manipulates the retro-reflective body so that the light penetrating through the first window turns to the probe through the second window, thereby allowing the retro-reflective body to step aside from an optical path. The reference gas feeding part feeds reference gas to inside the outer casing.</p>
申请公布号 KR101317058(B1) 申请公布日期 2013.10.11
申请号 KR20130066510 申请日期 2013.06.11
申请人 DONGWOO OPTRON 发明人 YEON, KYU CHEOL;KANG, SOON JOONG;LEE, KYONG WOO
分类号 G01N21/31 主分类号 G01N21/31
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