发明名称 |
DEPOSITION METHOD TO SILICON CARBIDE SUBSTRATE |
摘要 |
PROBLEM TO BE SOLVED: To provide a method of improving uniformity of a doping concentration distribution in a process of performing epitaxial growth of a SiC film on a SiC substrate.SOLUTION: In the method of performing epitaxial growth of a conductive SiC film on a SiC substrate, by doping in addition to a first dopant an appropriate amount of a second dopant whose incorporated atom position is different from that of the first dopant, a concentration distribution of a main first dopant is compensated by a concentration distribution of a second dopant so that a doping concentration is uniformed. |
申请公布号 |
JP2013211500(A) |
申请公布日期 |
2013.10.10 |
申请号 |
JP20120082344 |
申请日期 |
2012.03.30 |
申请人 |
NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL & TECHNOLOGY;FUJI ELECTRIC CO LTD |
发明人 |
TAWARA TAKESHI;HARADA SHINSUKE |
分类号 |
H01L21/205;C23C16/42;H01L21/336;H01L29/12;H01L29/78 |
主分类号 |
H01L21/205 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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