发明名称 DEPOSITION METHOD TO SILICON CARBIDE SUBSTRATE
摘要 PROBLEM TO BE SOLVED: To provide a method of improving uniformity of a doping concentration distribution in a process of performing epitaxial growth of a SiC film on a SiC substrate.SOLUTION: In the method of performing epitaxial growth of a conductive SiC film on a SiC substrate, by doping in addition to a first dopant an appropriate amount of a second dopant whose incorporated atom position is different from that of the first dopant, a concentration distribution of a main first dopant is compensated by a concentration distribution of a second dopant so that a doping concentration is uniformed.
申请公布号 JP2013211500(A) 申请公布日期 2013.10.10
申请号 JP20120082344 申请日期 2012.03.30
申请人 NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL & TECHNOLOGY;FUJI ELECTRIC CO LTD 发明人 TAWARA TAKESHI;HARADA SHINSUKE
分类号 H01L21/205;C23C16/42;H01L21/336;H01L29/12;H01L29/78 主分类号 H01L21/205
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