发明名称 Method of manufacturing a semiconductor device
摘要 In a method of manufacturing a semiconductor device, a barrier metal film and an aluminum metal film are formed on an insulating film on a semiconductor substrate. Two aluminum electrodes are formed in parallel with each other by patterning the barrier metal film and the aluminum metal film. The aluminum metal film in a region of part of each of the two aluminum electrodes are selectively removed to form two single-layer barrier metal electrodes separated from each other. A resistor is formed between the two single-layer barrier metal electrodes so as to electrically connect the two single-layer barrier metal electrodes to each other.
申请公布号 US8551854(B2) 申请公布日期 2013.10.08
申请号 US201213409234 申请日期 2012.03.01
申请人 KATO SHINJIRO;HARADA HIROFUMI;SEIKO INSTRUMENTS INC. 发明人 KATO SHINJIRO;HARADA HIROFUMI
分类号 H01L29/8605 主分类号 H01L29/8605
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