发明名称 Method for manufacturing multi-gate transistor device
摘要 A method for manufacturing a multi-gate transistor device includes providing a semiconductor substrate having a first patterned semiconductor layer formed thereon, sequentially forming a gate dielectric layer and a gate layer covering a portion of the first patterned semiconductor layer on the semiconductor substrate, removing a portion of the first patterned semiconductor layer to form a second patterned semiconductor layer, and performing a selective epitaxial growth process to form an epitaxial layer on a surface of the second patterned semiconductor layer.
申请公布号 US8551829(B2) 申请公布日期 2013.10.08
申请号 US20100943015 申请日期 2010.11.10
申请人 CHIEN CHIN-CHENG;WU CHUN-YUAN;LIU CHIH-CHIEN;LIN CHIN-FU;TSAI TENG-CHUN;UNITED MICROELECTRONICS CORP. 发明人 CHIEN CHIN-CHENG;WU CHUN-YUAN;LIU CHIH-CHIEN;LIN CHIN-FU;TSAI TENG-CHUN
分类号 H01L21/00;H01L21/70;H01L21/84 主分类号 H01L21/00
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