发明名称 |
Method for manufacturing multi-gate transistor device |
摘要 |
A method for manufacturing a multi-gate transistor device includes providing a semiconductor substrate having a first patterned semiconductor layer formed thereon, sequentially forming a gate dielectric layer and a gate layer covering a portion of the first patterned semiconductor layer on the semiconductor substrate, removing a portion of the first patterned semiconductor layer to form a second patterned semiconductor layer, and performing a selective epitaxial growth process to form an epitaxial layer on a surface of the second patterned semiconductor layer.
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申请公布号 |
US8551829(B2) |
申请公布日期 |
2013.10.08 |
申请号 |
US20100943015 |
申请日期 |
2010.11.10 |
申请人 |
CHIEN CHIN-CHENG;WU CHUN-YUAN;LIU CHIH-CHIEN;LIN CHIN-FU;TSAI TENG-CHUN;UNITED MICROELECTRONICS CORP. |
发明人 |
CHIEN CHIN-CHENG;WU CHUN-YUAN;LIU CHIH-CHIEN;LIN CHIN-FU;TSAI TENG-CHUN |
分类号 |
H01L21/00;H01L21/70;H01L21/84 |
主分类号 |
H01L21/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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