发明名称 Gate Overvoltage Protection for Compound Semiconductor Transistors
摘要 A transistor device includes a compound semiconductor body, a drain disposed in the compound semiconductor body and a source disposed in the compound semiconductor body and spaced apart from the drain by a channel region. A gate is provided for controlling the channel region. The transistor device further includes a gate overvoltage protection device connected between the source and the gate, the gate overvoltage protection device including p-type and n-type silicon-containing semiconductor material.
申请公布号 US2013256699(A1) 申请公布日期 2013.10.03
申请号 US201213435447 申请日期 2012.03.30
申请人 VIELEMEYER MARTIN;HUTZLER MICHAEL;CURATOLA GILBERTO;POZZOVIVO GIANMAURO;INFINEON TECHNOLOGIES AUSTRIA AG 发明人 VIELEMEYER MARTIN;HUTZLER MICHAEL;CURATOLA GILBERTO;POZZOVIVO GIANMAURO
分类号 H01L29/778;H01L29/16;H01L29/20 主分类号 H01L29/778
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