发明名称 Optoelectronic apparatus for measuring structural sizes or object sizes and method of calibration
摘要 An optoelectronic apparatus is set forth for measuring structural sizes or object sizes which has a light reception element for converting received light into image data, a reception optics arranged before the light reception element as well as an evaluation unit which is configured to identify structures or objects in the image data, to determine its dimensions in picture elements and to convert the dimensions into absolute, in particular metric, units of length with reference to a scaling factor, wherein the scaling factor can be determined in a calibration procedure. In this respect, the evaluation unit is configured to locate code regions in the image data and to read out code information from the code regions and to calculate the scaling factor during the calibration procedure from dimensions of a calibration code whose code information includes a size indication for the calibration code in the absolute units of length.
申请公布号 US2013256411(A1) 申请公布日期 2013.10.03
申请号 US201313796746 申请日期 2013.03.12
申请人 SICK AG 发明人 SCHULER PASCAL;RINKLIN DIETRAM;BURGHARDT SASCHA
分类号 G06K7/00 主分类号 G06K7/00
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