发明名称 SELECTED WORD LINE DEPENDENT SELECT GATE DIFFUSION REGION VOLTAGE DURING PROGRAMNMING
摘要 <p>Methods and devices for operating non-volatile storage are disclosed. One or more programming conditions depend on the location of the word line that is selected for programming. Applying a selected word line dependent program condition may reduce or eliminate program disturb. The voltage applied to a common source line may depend on the location of the word line that is selected for programming. This may prevent or reduce punch-through conduction, which may prevent or reduce program disturb. The voltage applied to bit lines of unselected NAND strings may depend on the location of the word line that is selected for programming. This may prevent or reduce punch-through conduction.</p>
申请公布号 WO2013147936(A1) 申请公布日期 2013.10.03
申请号 WO2012US66610 申请日期 2012.11.27
申请人 SANDISK TECHNOLOGIES, INC.;LAI, CHUN-HUNG;SATO, SHINJI;LEE, SHIH-CHUNG;HEMINK, GERRIT JAN 发明人 LAI, CHUN-HUNG;SATO, SHINJI;LEE, SHIH-CHUNG;HEMINK, GERRIT JAN
分类号 G11C11/56;G11C16/04;G11C16/10 主分类号 G11C11/56
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