发明名称 APPARATUS AND METHOD FOR TREATING SUBSTRATE
摘要 <p>PURPOSE: A substrate processing apparatus and a method thereof are provided to perform a uniform process on a substrate by making uniform the intensity of a standing wave. CONSTITUTION: A lower electrode (210) is located in the space of a process chamber. The lower electrode supports the substrate. An upper electrode (300) is formed in the upper part of the lower electrode and faces the lower electrode. A high frequency applying line has a contact point for applying high frequency power to the lower electrode. A modulator (600) asymmetrically provides a dielectric material to the lower part of the lower electrode around the center of the lower electrode.</p>
申请公布号 KR20130107934(A) 申请公布日期 2013.10.02
申请号 KR20120030134 申请日期 2012.03.23
申请人 SAMSUNG DISPLAY CO., LTD. 发明人 FUKASAWA TAKAYUKI;KIM, KI HYUK;KIM, JI HUN
分类号 H01L21/3065;H01L21/205 主分类号 H01L21/3065
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