发明名称
摘要 <P>PROBLEM TO BE SOLVED: To provide a polymer compound, positive type resist composition and resist pattern forming method using the positive type resist composition. <P>SOLUTION: This polymer compound includes: a constitutional unit (a0) derived from a vinyl compound having 1 to 2 hydroxy groups and 0 to 2 alkyl groups-substituted naphthalene ring at a side chain; a constitutional unit (a1) derived from acrylic ester containing acid-dissociable dissolution-inhibiting radical; a constitutional unit (a2) derived from acrylic ester containing a lactone-containing ring radical; and a constitutional unit (a3) derived from acrylic ester containing a polar group-containing aliphatic hydrocarbon radical. <P>COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP5303122(B2) 申请公布日期 2013.10.02
申请号 JP20070155419 申请日期 2007.06.12
申请人 发明人
分类号 C08F212/14;C08F220/10;G03F7/004;G03F7/039;H01L21/027 主分类号 C08F212/14
代理机构 代理人
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