发明名称 Flip-Flop Circuit Having Test Input
摘要 The pulse generation circuit generates a first pulse signal and a complementary second pulse signal. The first and second pulse signals are activated simultaneously in a normal mode and activated selectively in response to a test input signal in a test mode. A multiplexing input circuit selects and outputs one of a data input signal and a test input signal as a latch input signal in response to the first pulse signal and the second pulse signal. The latch input signal corresponds to the data input signal in the normal mode and corresponds to the test input signal in the test mode. The latching circuit latches the latch input signal to generate data output signal. The length of data transfer path is reduced, and DtoQ delay can be decreased.
申请公布号 KR101314083(B1) 申请公布日期 2013.10.02
申请号 KR20070112636 申请日期 2007.11.06
申请人 发明人
分类号 H03K3/356 主分类号 H03K3/356
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