发明名称 INSPECTION APPARATUS, EXPOSURE DEVICE AND INSPECTION METHOD
摘要 PROBLEM TO BE SOLVED: To provide a technique which correctly suppresses variations in the light quantity distribution of exposure light at a comparatively early stage.SOLUTION: A detection part 51 inspects belt-like light used in drawing on a substrate. This detection part 51 includes: a one-dimensional CCD element 519 which measures the one-dimensional light quantity distribution at least in the short-width direction; and a detection part carrying mechanism by which the one-dimensional CCD element 519 is relatively moved to a spatial light modulator along the longitudinal direction of light.
申请公布号 JP2013197148(A) 申请公布日期 2013.09.30
申请号 JP20120059962 申请日期 2012.03.16
申请人 DAINIPPON SCREEN MFG CO LTD 发明人 YOSHIDA MITSUHIRO
分类号 H01L21/027;G03F7/20;H05K3/00 主分类号 H01L21/027
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