发明名称 METHOD FOR PRODUCING GROUP III NITRIDE SEMICONDUCTOR SINGLE CRYSTAL AND METHOD FOR PRODUCING GALLIUM NITRIDE SUBSTRATE
摘要 PROBLEM TO BE SOLVED: To provide a method for producing a group III nitride semiconductor single crystal from which a growth substrate is easily released and which is excellent in crystallinity and a method for producing a GaN substrate.SOLUTION: A mask layer 140 is formed on a GaN substrate G as a growth substrate 10. Next, a plurality of recesses X11 extending from the mask layer 140 to the GaN substrate G10 are formed by photolithography. It together with a raw material for a single crystal is placed in a crucible, and the pressure and the temperature are elevated. The GaN substrate G10 exposed through the recesses X11 undergoes melt back with a flux. By the melting of the GaN substrate G10, the recesses X11 are broadened to form recesses X12. A GaN layer 150 grows from the surfaces 144 of the mask layer 140 as a starting point. In this time, the GaN layer 150 grows without covering the recesses X12.
申请公布号 JP2013193922(A) 申请公布日期 2013.09.30
申请号 JP20120062530 申请日期 2012.03.19
申请人 TOYODA GOSEI CO LTD 发明人
分类号 C30B29/38;C30B19/12 主分类号 C30B29/38
代理机构 代理人
主权项
地址
您可能感兴趣的专利