发明名称 Device of preventing substrate of plasma processing apparatus from breakdown and method of thereof
摘要 A substrate damage prevention system and method for a plasma treating apparatus are provided. The system may include a lower electrode on which a substrate may be mounted, an inert gas supply unit which may supply an inert gas to an upper surface of the lower electrode on which the substrate is mounted, and an air supply unit which may supply air to the upper surface of the lower electrode. An inert gas may be supplied between the lower electrode and the substrate in order to control the temperature of the substrate during the chucking. Air may be supplied between the lower electrode and the substrate during dechucking in order to allow the substrate to be easily separated from the lower electrode.
申请公布号 KR101312292(B1) 申请公布日期 2013.09.27
申请号 KR20060125259 申请日期 2006.12.11
申请人 发明人
分类号 H01L21/205;H01L21/3065 主分类号 H01L21/205
代理机构 代理人
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