发明名称 METHODS AND APPARATUS FOR CORRECTING FOR NON-UNIFORMITY IN A PLASMA PROCESSING SYSTEM
摘要 <p>A plasma processing system having a plasma processing chamber comprising at least one of a chamber wall and a chamber liner is disclosed. The plasma processing system includes a plurality of ground straps disposed around a circumference of a chamber surface, the chamber surface being one of the chamber walls and the chamber liner of the plasma processing chamber. The plasma processing system further includes at least a first impedance device coupled to at least a first ground strap of th e plurality of ground straps, wherein a second ground strap of the plurality of ground straps is not provided with a second impedance device having the same impedance value as the first impedance device.</p>
申请公布号 WO2013142173(A1) 申请公布日期 2013.09.26
申请号 WO2013US30701 申请日期 2013.03.13
申请人 LAM RESEARCH CORPORATION 发明人 NAM, SANG, KI
分类号 C23C16/00 主分类号 C23C16/00
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