| 摘要 |
PROBLEM TO BE SOLVED: To provide a small pattern illumination apparatus which can emit a pattern capable of achieving a precise distance measurement, and a distance measuring apparatus which measures a distance to a measurement object by using the pattern illumination apparatus.SOLUTION: A pattern illumination apparatus 1 according to a first embodiment of the present invention, which projects a pattern to a measurement object to measure a distance to the measurement object that is not shown, comprises: a semiconductor laser (light source) 2 that emits light for projecting pattern light 5; a coupling lens (optical means) 3 that converts the light emitted from the semiconductor laser 2 to parallel light; a diffraction optical element 4 that diffracts the parallel light converted by the coupling lens 3. The pattern light 5 emitted from the diffraction optical element 4 and projected to the measurement object is a pattern formed by randomly arranging pixels each having luminance distribution of multi-gradation which is three gradations or more. |
