发明名称 LIGHT BEAM PATH MONITORING DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a light beam path monitoring device capable of highly accurately measuring a position of a reflection point existing in a light beam path.SOLUTION: A light beam path monitoring device comprises: a semiconductor laser 5 oscillating at a single wavelength; a phase adjuster 6 in which output light of the semiconductor laser 5 adjusts a phase with reflected return light from a reflection position in a light beam path to be measured; an optical branching filter 7 splitting the output light of the semiconductor laser into a light beam path 16 to be measured and a light beam path 12 for monitoring; and a frequency spectrum observer 9 observing a frequency spectrum of propagation light from the light beam path 12 for monitoring. The output light of the semiconductor laser 5 and the reflected return light resonate with each other to generate modes at a plurality of frequencies. The light beam path monitoring device has a function to identify a reflection position in the light beam path to be measured on the basis of an interval of the modes of the frequency spectrum.
申请公布号 JP2013190348(A) 申请公布日期 2013.09.26
申请号 JP20120057225 申请日期 2012.03.14
申请人 NIPPON TELEGR & TELEPH CORP <NTT> 发明人 ENDO JUN;ITO TOSHIO;ASAKA KOTA;YONEYAMA MIKIO
分类号 G01M11/00 主分类号 G01M11/00
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