发明名称 PLASMA PROCESSING APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a plasma processing apparatus which optionally adjusts the distribution of plasma density in a processing chamber and inhibits the rise of the costs.SOLUTION: A plasma processing apparatus 10 includes: an ICP antenna 13 that is disposed in the exterior of a chamber 11 so as to face a placement base 12 and supplies high-frequency power to the interior of the chamber 11; and a window member 14 that forms a part of a ceiling part of the chamber 11, is disposed between the placement base 12 and the ICP antenna 13, and is formed by a conductor. The window member 14 has a number of transmission units 19 allowing the high-frequency power to be transmitted in a thickness direction of the wind member 14. Each of the transmission unit 19 has a slit 24 that penetrates through the window member 14 in the thickness direction and has an adjustable width.
申请公布号 JP2013191593(A) 申请公布日期 2013.09.26
申请号 JP20120054484 申请日期 2012.03.12
申请人 TOKYO ELECTRON LTD 发明人 IIZUKA YASHIRO
分类号 H01L21/3065;H05H1/46 主分类号 H01L21/3065
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