| 摘要 |
PURPOSE: A test jig for memory module is provided to test a plurality of memories at the same time, thereby reducing test time. CONSTITUTION: A test jig for memory module comprises a base plate (100) and a clamping member (200). The base plate is mounted on a tester. The clamping member comprises fixing parts (210), both-sided slot groove portions (220), and connection parts (230). The fixing parts are mounted on the center of the base plate. The both-sided slot groove portions are rotatably arranged at both ends of the fixing part by the medium of an elastically supporting means. Both ends of a memory module are supported by both sides of the both-sided slot groove portions. The connection parts couple the both-sided slot groove portions such that the both-sided slot groove portions are connected to each other, and are selectively locked and coupled to the base plate by the medium of a locking means. |
