| 摘要 |
An impact testing device used for testing impact resistance of electronic devices is provided. The impact testing device includes a main body, a pneumatic pump connecting to one end of the main body and communicating with the main body, a transmitting element connecting to the other end of the main body and communicating with the main body, and an impact head fastened on the transmitting element. The pneumatic pump renders the main body a pressure to drive the transmitting element and make the impact head move to hit the testing point of the electronic device.
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