SINGLE PARTICLE ANALYZER AND ANALYSIS METHOD

摘要

According to one embodiment of the present invention, provided is a single particle analyzer equipped with: a measuring vessel; a first chamber and a second chamber in which the measuring vessel is partitioned by insulating partition walls; a through-hole linking the first chamber and the second chamber, which are open at the partition walls; a first electrode disposed inside the first chamber; and a second electrode disposed inside the second chamber. Power flows between the first electrode and the second electrode, through the through-hole of the partition walls. When a particulate object to be measured, which is inside the first chamber, passes to the inside of the second chamber from the through-hole, the electrical characteristics of said object are measured, and the shape of said object is determined. (a) If the diameter of the particle to be measured is denoted as a, the diameter of the through-hole is denoted as d, and the thickness of the partition walls near the through-hole is denoted as t, the formula, t < a < d <= 100a, is satisfied; or (b) if the major axis of the particle to be measured is denoted as L, the minor axis is denoted as s, the diameter of the through-hole is denoted as d, and the thickness of the partition walls near the through-hole is denoted as t, the formulas, s < L, s < d <= 100s, and t < L, are satisfied.