发明名称 |
END-OF-LIFE RELIABILITY FOR NON-VOLATILE MEMORY CELLS |
摘要 |
A memory chip includes a memory array and a two-dimensional sensing system. The array includes a multiplicity of memory cells connected in rows by word lines and in columns by bit lines. The sensing system moves a read point two-dimensionally within a two-dimensional read space as the two-dimensional read space shrinks and shifts over the life of the chip.
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申请公布号 |
US2013242669(A1) |
申请公布日期 |
2013.09.19 |
申请号 |
US201213423229 |
申请日期 |
2012.03.18 |
申请人 |
BLOOM ILAN;KUSHNARENKO ALEXANDER;SPANSION ISRAEL LTD |
发明人 |
BLOOM ILAN;KUSHNARENKO ALEXANDER |
分类号 |
G11C16/28;G11C16/04 |
主分类号 |
G11C16/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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