发明名称 SEMICONDUCTOR MATERIAL DOPING
摘要 <p>A solution for designing and/or fabricating a structure including a quantum well and an adjacent barrier is provided. A target band discontinuity between the quantum well and the adjacent barrier is selected to coincide with an activation energy of a dopant for the quantum well and/or barrier. For example, a target valence band discontinuity can be selected such that a dopant energy level of a dopant in the adjacent barrier coincides with a valence energy band edge for the quantum well and/or a ground state energy for free carriers in a valence energy band for the quantum well. Additionally, a target doping level for the quantum well and/or adjacent barrier can be selected to facilitate a real space transfer of holes across the barrier. The quantum well and the adjacent barrier can be formed such that the actual band discontinuity and/or actual doping level(s) correspond to the relevant target(s).</p>
申请公布号 WO2013138573(A1) 申请公布日期 2013.09.19
申请号 WO2013US31263 申请日期 2013.03.14
申请人 SENSOR ELECTRONIC TECHNOLOGY, INC. 发明人 SHATALOV, MAXIM, S;GASKA, REMIGIJUS;YANG, JINWEI;SHUR, MICHAEL;DOBRINSKY, ALEXANDER
分类号 H01L21/20;H01L33/14 主分类号 H01L21/20
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