| 摘要 |
Provided is a test system of a semiconductor integrated circuit including an output device and an input device for conducting an input/output characteristics test of the output device and the input device inside the semiconductor integrated circuit. In the system, a transmission line provided in a test board where the semiconductor integrated circuit is mounted on establishes a wired connection between an external terminal of one circuit of one of the output device and the input device and external terminals of a plurality of circuits of another one of the output device and the input device.
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