| 摘要 |
A magnetic particle inspection (MPI) device 10 comprises a light source 16 for illuminating an object under test, a magnetic particle applicator 14 for selectively applying magnetic particles to the object, and a handle 12 for manual positioning of the light source and applicator at a desired location relative to the object. A flowpath is provided for directing a flow of magnetic fluid within the device which comprises supply channel 36 for receiving fluid from a supply and conveying it to the applicator, and a bypass channel 38 for returning fluid to the supply. The light source may be a UV light source 28 and the device includes a mount on the handle 12 for mounting the source 28. The device may include means to connect to a magnetization source and actuators to switch the particle supply and the magnetization source. |
