发明名称 Process for selectively patterning a magnetic film structure
摘要 Processes for selectively patterning a magnetic film structure generally include selectively etching an exposed portion of a freelayer disposed on a tunnel barrier layer by a wet process, which includes exposing the freelayer to an etchant solution comprising at least one acid and an organophosphorus acid inhibitor or salt thereof, stopping on the tunnel barrier layer.
申请公布号 US8535953(B2) 申请公布日期 2013.09.17
申请号 US201213350174 申请日期 2012.01.13
申请人 ABRAHAM DAVID W.;ASSEFA SOLOMON;O'SULLIVAN EUGENE J.;INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 ABRAHAM DAVID W.;ASSEFA SOLOMON;O'SULLIVAN EUGENE J.
分类号 H01L21/00;H01L21/20;H01L21/302;H01L21/461 主分类号 H01L21/00
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