发明名称 POLYCRYSTALLINE SILICON WAFER
摘要 <p>Provided is a polycrystalline silicon wafer produced by a melting and unidirectional solidification method, where the polycrystalline silicon wafer has a diameter of 450 mm or more, a thickness of 900 mum or more, and an average crystal grain size of 5 to 50 mm, and is made up of one piece. The present invention provides a large-sized polycrystalline silicon wafer having a wafer size of 450 mm or more, of which: mechanical properties are similar to those of monocrystalline silicon wafers; the crystal size is large; the surface roughness is low; the surface has a high cleanliness; the polished surface has less unevenness by having a definite crystal orientation; and the sag value is similar to that of monocrystalline silicon wafers.</p>
申请公布号 KR20130102652(A) 申请公布日期 2013.09.17
申请号 KR20137022002 申请日期 2012.03.08
申请人 JX NIPPON MINING & METALS CORPORATION 发明人 TAKAMURA HIROSHI;SUZUKI RYO
分类号 C01B33/02;C30B29/06 主分类号 C01B33/02
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