| 摘要 |
PROBLEM TO BE SOLVED: To reduce a test time.SOLUTION: Described is a test device for testing devices under test, which includes controllers which sequentially execute a plurality of test programs to control testing of devices under test, and test modules, each of which is controlled by controllers to test the devices under test by communicating with the devices under test and transmits a test result for each test program to the controllers. Each test module has a plurality of memories for storing a test result for each test program. A subsequent test is started with such a timing that at least a part of a result processing period, which is a period from start of transmission of the test result stored in a first memory to the controller to the end of processing of the test result by the controller, overlaps with a part of a test execution period in which the subsequent test is executed using a second memory. |
