| 摘要 |
<p>In the present invention, measurements are performed with more uniform precision than achieved in the past across the entirety of a measurement region upon which a lattice pattern is projected. A shape-measurement device is provided with a light-generating unit for generating light, a projection unit for varying the radiation direction of light generated by the light-generating unit to scan light on the measurement object, a control unit for cyclically varying the intensity of light generated by the light-generating unit and controlling the light-generating unit so that the amplitude of the variation in intensity of the generated light is caused to vary according to the radiation direction, an image-capturing unit for capturing an image of the measurement object, and a measurement unit for calculating the three-dimensional shape of the measurement object on the basis of the image of the measurement object obtained by the image-capturing unit.</p> |
