发明名称 |
FINFET DESIGN WITH LDD EXTENSIONS |
摘要 |
<p>PURPOSE: A FINFET design using an LDD extension is provided to maximize a channel width by forming a dielectric layer on a gate electrode dielectric layer. CONSTITUTION: A fin (120) is made of pure silicon. A semiconductor substrate is patterned by the fin. A gate dielectric layer (140) is formed in the upper part of the fin and a separation structure (130). A gate electrode layer (150) is formed on the gate dielectric layer. A gate electrode layer includes a conductive material.</p> |
申请公布号 |
KR20130100658(A) |
申请公布日期 |
2013.09.11 |
申请号 |
KR20120058736 |
申请日期 |
2012.05.31 |
申请人 |
TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. |
发明人 |
MOR YI SHIEN;CHEN HSIAO CHU;CHIANG MU CHI |
分类号 |
H01L21/336;H01L29/78 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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